Accurate crack assessment in electroluminescence (EL) images is important for photovoltaic (PV) reliability analysis, yet existing segmentation methods often fail to capture the thin, elongated, and structurally constrained nature of crack defects. This paper proposes a Solar Topology Crack Network (STC-Net) that incorporates edge priors, spectral priors, and a boundary-topology refinement module to improve crack continuity and boundary preservation.

The framework further extends segmentation to power-loss estimation by deriving a crack-associated inactive-area proxy from the predicted masks. Experiments on the PVEL-S dataset show that STC-Net achieves 95.98 MIoU, 98.01 MDice, and 98.00 MAcc during training, and 72.52 MIoU and 80.16 MDice on unseen test samples.

These results demonstrate that STC-Net provides accurate crack localization while offering a practical link between EL-based defect segmentation and PV degradation assessment.